Experimental Progress towards Probing the Ground State of an Electron-Hole Bilayer by Low-Temperature Transport

Figure 12

(a) Electron and hole drag resistivity versus temperature for 𝑛=𝑝=7 and 11×10¹⁰ cm⁻² versus temperature, down to 50 mK. 𝑇² coefficients are 0.0035 and 0.051Ω/□K⁻², respectively. (b) I-V (a.c. 𝑓=7.2Hz) trace for drag on hole layer for 𝑛=𝑝=9×10¹⁰ cm⁻² at temperatures indicated. The resistances found from these slopes are displayed on (a). (c) In- and out-of-phase components of the drag voltage (𝑉_drag) for the 𝑛=𝑝=7×10¹⁰ cm⁻² trace. Electron and hole layer mobilities for 𝑛=𝑝=7×10¹⁰ cm⁻² at 𝑇=1.5 K; 𝜇_𝑒=6.8×10⁵ cm²V⁻¹s⁻¹ and 𝜇_ℎ=3.3×10⁵ cm²V⁻¹s⁻¹. (Device: B135/C3-4-25 nm Barrier).

(a)

(b)

(c)