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Advances in Condensed Matter Physics
Volume 2013, Article ID 308258, 11 pages
http://dx.doi.org/10.1155/2013/308258
Research Article

Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

1Institute of Optical Materials and Technologies “Acad. J. Malinowski,” Bulgarian Academy of Sciences, Acad. G. Bonchev Street, Building 109, 1113 Sofia, Bulgaria
2Geological Institute, Bulgarian Academy of Sciences, Acad. G. Bonchev Street, Building 24, 1113 Sofia, Bulgaria
3Faculty of Physics, Sofia University “St. Kliment Ohridski,” 5 James Boucher Avenue, 1164 Sofia, Bulgaria

Received 4 March 2013; Revised 20 May 2013; Accepted 22 May 2013

Academic Editor: R. N. P. Choudhary

Copyright © 2013 R. Todorov et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. Todorov, J. Tasseva, V. Lozanova, A. Lalova, Tz. Iliev, and A. Paneva, “Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices,” Advances in Condensed Matter Physics, vol. 2013, Article ID 308258, 11 pages, 2013. https://doi.org/10.1155/2013/308258.