Recent Approaches for Broadening the Spectral Bandwidth in Resonant Cavity Optoelectronic Devices

Figure 9

(a) The relative reflectance mapping image of a 2′′ full-wafer DBR fabricated on a Si substrate. The letters A–E represent each position for measuring the reflectivity. (b) The measured reflectivity of all positions of the DBR fabricated on a 2′′ Si wafer as a function of wavelength [46].