Advances in Condensed Matter Physics / 2015 / Article / Fig 1

Research Article

Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model

Figure 1

Equipotential distribution of the tip-sample system in Electrostatic Force Microscopy for 3 different thin film screening lengths. The arrow shown in the potential distribution shows the region that has been simulated.
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