Advances in Condensed Matter Physics / 2015 / Article / Fig 3

Research Article

Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model

Figure 3

(a) Vertical electrostatic force as a function of the screening length. (b) Vertical electrostatic force as a function of the thin film dielectric constant. Inset shows the values of the force for smaller dielectric constants. In both figures, the force has been calculated for  nm and  nm, and  nm,  nm, , and  V.

We are committed to sharing findings related to COVID-19 as quickly and safely as possible. Any author submitting a COVID-19 paper should notify us at to ensure their research is fast-tracked and made available on a preprint server as soon as possible. We will be providing unlimited waivers of publication charges for accepted articles related to COVID-19. Sign up here as a reviewer to help fast-track new submissions.