Structural Characterization of Natural and Processed Zircons with X-Rays and Nuclear Techniques

Table 2

Results of Rietveld quantitative analysis (wt%) RIR. Standard parameters for ZrSiO4 are from literature (ICSD 9582).

Sample	ZrSiO4	Amorphous
USA	49.91	50.12	6.60591	5.98781	1.884	0.089	0.069
USA4	66.82	33.24	6.60581	5.98641	3.347	0.122	0.096
AUS	48.51	51.52	6.60751	5.99271	2.182	0.095	0.074
AUS4	59.11	40.83	6.60771	5.99241	3.675	0.124	0.091
SOU	39.71	60.31	6.60661	5.99182	2.054	0.093	0.071
SOU4	57.61	42.44	6.60721	5.99251	3.587	0.123	0.094
ZrSiO4			6.6122	5.9942