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Advances in Condensed Matter Physics
Volume 2018, Article ID 3787843, 10 pages
https://doi.org/10.1155/2018/3787843
Research Article

Tadpole-Shaped POSS-Based Copolymers and the Aggregation Behavior at Air/Water Interface

1Research & Development Institute, Northwestern Polytechnical University, Shenzhen, China
2Key Laboratory of Polymer Science and Technology, Shaanxi Province, School of Science, Northwestern Polytechnical University, Xi’an 710129, China
3Key Laboratory of Space Applied Physics and Chemistry, Ministry of Education, School of Science, Northwestern Polytechnical University, Xi’an 710072, China

Correspondence should be addressed to Fang Chen; nc.ude.upwn@118028gnafnehc

Received 21 August 2017; Accepted 18 October 2017; Published 1 January 2018

Academic Editor: Da-Ren Hang

Copyright © 2018 Lin Zhu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The aggregation behavior of three tadpole-shaped Polyhedral oligomeric silsesquioxane (POSS) based block copolymers using different blocks poly(methyl methacrylate) (PMMA) and poly(trifluoroethyl methacrylate) (PTFEMA) with different block sequence and ratio (POSS-PTFEMA161-b-PMMA236, POSS-PMMA277-b-PTFEMA130, and POSS-PMMA466-b-PTFEMA172) was investigated on the air-water interface. The interfacial rheology of three block copolymers was studied by surface pressure isotherm, compression modulus measurements, and compression and expansion hysteresis analysis on the Langmuir trough. The block sequence and ratio play a great role in self-assembly behavior at the interface. Based on surface pressure isotherm analysis, a thin film with low elasticity was achieved for the POSS-PTFEMA161-b-PMMA236. Moreover, for the block copolymer with same segment sequence (POSS-PMMA2-b-PTFEMA), the thin film compression capability is increased with increasing the PMMA ratio. The morphology of the deposited LB thin film was illustrated by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). We observed that a thin film was composed by crater-shaped quasi-2D micelles for POSS-PTFEMA-b-PMMA, while it was proved that only flaky texture was observed for both POSS-PMMA277-b-PTFEMA130 and POSS-PMMA466-b-PTFEMA172. The thickness and area of flaky aggregates were greatly related to PMMA ratio. The different interface self-assembly structure evolution was proposed based on the interfacial rheology and thin film morphology studies.