R. Kasap, E. Kurt, "Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test", Advances in Decision Sciences, vol. 2, Article ID 162872, 7 pages, 1998. https://doi.org/10.1155/S117391269800011X
Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test
In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each values.
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