Advances in Decision Sciences

Advances in Decision Sciences / 1998 / Article

Open Access

Volume 2 |Article ID 162872 | https://doi.org/10.1155/S117391269800011X

R. Kasap, E. Kurt, "Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test", Advances in Decision Sciences, vol. 2, Article ID 162872, 7 pages, 1998. https://doi.org/10.1155/S117391269800011X

Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test

Abstract

In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each e values.

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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