Table of Contents
Journal of Applied Mathematics and Decision Sciences
Volume 2, Issue 2, Pages 193-199
http://dx.doi.org/10.1155/S117391269800011X

Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test

1Department of Statistics, Gazi University, Ankara, Turkey
2Department of Physics Education, Gazi University, Ankara, Turkey

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. Kasap and E. Kurt, “Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test,” Journal of Applied Mathematics and Decision Sciences, vol. 2, no. 2, pp. 193-199, 1998. https://doi.org/10.1155/S117391269800011X.