Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

<div>Magnitude (dB) of S<sub>11</sub> and S<sub>21</sub> for<i> model A1</i> using only the TEM mode at the input/output coaxial lines, for different values of the virtual circular waveguide containing the sample (thickness<i> d</i>=0.2 mm).</div>

Advances in Mathematical Physics

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Figure 7

Figure 7: Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups 

Figure 7 | Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups 