Advances in Mathematical Physics / 2019 / Article / Tab 1

Research Article

Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

Table 1

Basic data for the test cases.


IO coaxial (b)1.75 mm
IO coaxial (a)0.46 mm
(MUT)10-j0.1 (=0.01)
(MUT)5-j0.05 (=0.01)
Sample Thickness (d)0.2 mm/1.0 mm
Frequency range100 MHz – 20 GHz