Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

Table 1

Basic data for the test cases.

Item	Value
IO coaxial (b)	1.75 mm
IO coaxial (a)	0.46 mm
	2.54
(MUT)	10-j0.1 (=0.01)
(MUT)	5-j0.05 (=0.01)
Sample Thickness (d)	0.2 mm/1.0 mm
Frequency range	100 MHz – 20 GHz