Advances in Materials Science and Engineering / 2008 / Article / Fig 2

Research Article

Estimation of Compositions of Zr-Cu Binary Sputtered Film and Its Characterization

Figure 2

X-ray diffraction patterns of Zn-Cu binary sputtered films with various Cu contents; (a) as-sputtered films and (b) after annealed at 723 K for 900 seconds in argon gas atmospher.
518354.fig.002a
(a)
518354.fig.002b
(b)