Advances in Materials Science and Engineering

Research Article

Estimation of Compositions of Zr-Cu Binary Sputtered Film and Its Characterization

Figure 3

(a) TEM observation of as-sputtered Zr-Cu film with 34 at% Cu, and (b) annealed at 723 K in argon gas atmosphere.
518354.fig.003a
(a)
518354.fig.003b
(b)