Advances in Materials Science and Engineering / 2010 / Article / Fig 5

Research Article

Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

Figure 5

XPS spectra of (a) Bi 4f, (b) Ca 2p, (c) Ti 2p peaks for CBTi144 thin films deposited by the soft chemical method at 700 C for 2 hours.
710269.fig.005a
(a)
710269.fig.005b
(b)
710269.fig.005c
(c)

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