Advances in Materials Science and Engineering / 2010 / Article / Fig 7

Research Article

Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

Figure 7

(a) Long-time retention characteristics at various electric fields (75 to 300 kV/cm), and (b) the long-time retention characteristics ( and ) measured at an applied electric field of 150 kV/cm for CBTi144 thin film deposited on (100) Pt/Ti/SiO2/Si substrate at 700 C for 2 hours.
710269.fig.007a
(a)
710269.fig.007b
(b)

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