Research Article

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

Figure 4

Secondary ion images for sodium, nickel, and carbon from part of a nickel finder grid on an adhesive carbon patch. Field of view is 20 × 20 microns. Oxygen flooding was used to enhance the nickel signal. Because the full dataset is three dimensional, it could be shown that the sodium signal was only present at the surface of the sample. The colour scale intensity units are ions per raw voxel (1024 × 1024 × 178); for display purpose the data has been binned to 128 × 128 × 178).
180437.fig.004