High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with <i>In Situ</i> AFM

<table>Mass spectrum from nickel finder grid on adhesive carbon patch (see also Figure <a href="../fig4/">4</a>). About six decades of dynamic range are exhibited by this spectrum. Note the relatively large molecular oxygen peak due to the use of oxygen flooding to enhance the nickel ion signal.</table>

Advances in Materials Science and Engineering

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Figure 6

Figure 6: High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with <i>In Situ</i> AFM 

Figure 6 | High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM 