Application of Resonant Nuclear Reactions for Studying the Diffusion of Nitrogen and Silicon in Ti-Modified Stainless Steel
Figure 1
(a) Experimental depth profile of 15N implanted in steel to a fluence of 5 × 1015 N/cm2 obtained using RNRA. The experimental data points (closed triangle) are fitted into two Gaussians whose peaks are centered at ~20 nm (dotted line) and 42 nm (dashed line). (b) SRIM simulation of 30 keV nitrogen in steel depicting the implanted ion and vacancy profiles.
