Advances in Materials Science and Engineering / 2012 / Article / Fig 3

Review Article

Nonstoichiometry in Studied by Ion Beam Methods and Photoelectron Spectroscopy

Figure 3

Comparison between the experimental RBS spectra of a thin film deposited by rf sputtering on different substrates: thermally oxidized Si wafer (Si/SiO2) and carbon foil C.
826873.fig.003

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.