Research Article

Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement

Figure 1

(a) TG/DTA measurement curves on TiO2 sol and (b) UV-transmittance measurement of TiO2 film grown on glass. The inset shows Tauc plot to determine the band gap of the present film.
458478.fig.001a
(a)
458478.fig.001b
(b)