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Advances in Materials Science and Engineering
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Advances in Materials Science and Engineering
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2014
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Article
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Fig 6
/
Research Article
Electrical Characterization of Sol-Gel Derived TiO
2
Film on c-Si Substrate by Admittance Measurement
Figure 6
(a) Capacitance and (b) conductance as a function of bias voltage on Ag/TiO
2
/p-c-Si structure within dark ambient.
(a)
(b)