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Advances in Materials Science and Engineering
Volume 2015 (2015), Article ID 920421, 11 pages
http://dx.doi.org/10.1155/2015/920421
Research Article

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41 Prospect Nauky, Kyiv 03028, Ukraine
2Taras Shevchenko Kyiv National University, Physics Department, 2 Prospect Academician Glushkov, Kyiv 03022, Ukraine

Received 5 January 2015; Revised 5 April 2015; Accepted 6 April 2015

Academic Editor: Lian Gao

Copyright © 2015 Anna Evmenova et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Anna Evmenova, Volodymyr Odarych, Mykola Vuichyk, and Fedir Sizov, “Ellipsometric Analysis of Cadmium Telluride Films’ Structure,” Advances in Materials Science and Engineering, vol. 2015, Article ID 920421, 11 pages, 2015. doi:10.1155/2015/920421