Advances in Materials Science and Engineering / 2015 / Article / Fig 5

Research Article

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Figure 5

Refractive index and index of extinction of outer layer of cadmium telluride films (symbols), grown on silicon (a) and CdHgTe (b) substrates. Curves present optical constants’ change of the mixtures CdTe + oxide (1) and CdTe + air (2). Numbers near markers specify the volume fraction of oxide and air in mixtures.

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