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Advances in Materials Science and Engineering
Volume 2017, Article ID 8285230, 9 pages
https://doi.org/10.1155/2017/8285230
Research Article

Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

Groupe de Recherche sur les Couches Minces et la Photonique, Département de Physique et d’Astronomie, Université de Moncton, 18 avenue Antonine-Maillet, Moncton, NB, Canada E1A 3E9

Correspondence should be addressed to Serge Gauvin; ac.notcnomu@nivuag.egres

Received 30 March 2017; Revised 5 June 2017; Accepted 19 June 2017; Published 13 August 2017

Academic Editor: Angela De Bonis

Copyright © 2017 Jean Desforges et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jean Desforges, Luc Robichaud, and Serge Gauvin, “Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide,” Advances in Materials Science and Engineering, vol. 2017, Article ID 8285230, 9 pages, 2017. https://doi.org/10.1155/2017/8285230.