Advances in Materials Science and Engineering / 2017 / Article / Fig 7

Research Article

Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

Figure 7

Comparison of the real (a) and imaginary (b) parts of the complex refractive index for the as-deposited thin film (see Figure 6).