Advances in Materials Science and Engineering / 2018 / Article / Fig 6

Research Article

Structural, Optical, and Electrical Characterization of β-Ga2O3 Thin Films Grown by Plasma-Assisted Molecular Beam Epitaxy Suitable for UV Sensing

Figure 6

versus hν dependence of Ga2O3 thin films grown at different substrate temperatures and a 1.5 sccm O2 flux.

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