Table of Contents
Advances in Optics
Volume 2014, Article ID 352316, 7 pages
Research Article

Self-Similarity in Transverse Intensity Distributions in the Farfield Diffraction Pattern of Radial Walsh Filters

Department of Applied Optics and Photonics, University of Calcutta, Acharya Prafulla Chandra Shiksha Prangan, JD-2, Sector-III, Salt Lake, Kolkata 700098, India

Received 30 April 2014; Revised 22 August 2014; Accepted 26 August 2014; Published 17 September 2014

Academic Editor: Xiushan Zhu

Copyright © 2014 P. Mukherjee and L. N. Hazra. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


In a recent communication we reported the self-similarity in radial Walsh filters. The set of radial Walsh filters have been classified into distinct self-similar groups, where members of each group possess self-similar structures or phase sequences. It has been observed that, the axial intensity distributions in the farfield diffraction pattern of these self-similar radial Walsh filters are also self-similar. In this paper we report the self-similarity in the intensity distributions on a transverse plane in the farfield diffraction patterns of the self-similar radial Walsh filters.