In Situ Raman Spectroscopy of COOH-Functionalized SWCNTs Trapped with Optoelectronic Tweezers
Figure 1
Characterization of COOH-functionalized SWCNTs used in this study. (a) Bright-field transmission electron micrograph. Scale bar = 50 nm. (b) Atomic force micrograph of SWCNTs on an aminopropylesilane-coated mica wafer. Scale bar = 1 μm.
