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Advances in OptoElectronics
Volume 2013, Article ID 568945, 4 pages
http://dx.doi.org/10.1155/2013/568945
Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Emcore, Broadband Division, 2015 W. Chestnut Street, Alhambra, CA 91803, USA

Received 16 September 2013; Revised 7 November 2013; Accepted 8 November 2013

Academic Editor: Michele Norgia

Copyright © 2013 Jia-Sheng Huang. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Effective and economical burn-in screening is important for technology development and manufacture of semiconductor lasers. We study the burn-in degradation behavior of wavelength-division multiplexing semiconductor lasers to determine the feasibility of short burn-in. The burn-in is characterized by the sublinear model and correlated with long-term reliability.