Advances in OptoElectronics / 2013 / Article / Fig 1

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Figure 1

(a) Case A burn-in behavior of  WDM lasers. The laser cavity is 550 micrometer from wafers A and B. (b) Case B burn-in behavior of WDM lasers. The laser cavity is 550 micrometer from wafer C.
568945.fig.001a
(a)
568945.fig.001b
(b)

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