Advances in OptoElectronics / 2013 / Article / Fig 3

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Figure 3

Ith change versus stress current density of  WDM lasers of 550- and 1000-micron lengths.

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.