Advances in OptoElectronics / 2013 / Article / Fig 3

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Figure 3

Ith change versus stress current density of  WDM lasers of 550- and 1000-micron lengths.
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