All-Optical Surface Micropatterning by Electric Field Intensity Gradient

Figure 4

(a) Relative comparison of reflection DE slope coefficient for different As₂S₃ sample thickness of the record from the film-side and from the substrate-side and (b) obtained profile height comparison in both of these cases. 45 and −45 polarization holographic recording were performed by a 532 nm wavelength (, recording time , and period ).

(a)

(b)