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ElectroComponent Science and Technology
Volume 4, Issue 2, Pages 85-88
http://dx.doi.org/10.1155/APEC.4.85

Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M.

Plessey Company Limited, Northants, Caswell, UK

Received 30 May 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [2 citations]

The following is the list of published articles that have cited the current article.

  • Peter Uhlig, Alexandra Serwa, Jens Muller, Nam Gutzeit, Dieter Schwanke, and Jurgen Pohlner, “LTCC Resistors – The Influence of Production Conditions on the Absolute Value and its Reproducibility,” 2018 IMAPS Nordic Conference on Microelectronics Packaging (NordPac), pp. 61–66, . View at Publisher · View at Google Scholar
  • Andrzej Dziedzic, “Physicochemical investigations and nonstandard electrical measurements of inks and thick films—Bibliography,” Microelectronics Reliability, vol. 31, no. 2-3, pp. 537–548, 1991. View at Publisher · View at Google Scholar