Abstract
The dielectric constant data (at 3.5 MHz) on stearic acid thin films, obtained by using variable gap immersion method, are presented. Many of the errors of the conventional universal bridge method are eliminated in the method used here. It is also shown that the varying gap immersion method serves as an experimental tool for simultaneous determination of film thickness with high degree of accuracy. The data on evaporated as well as Langmuir films of stearic acid (≥1000 Å) are found to be consistent and in reasonable agreement.