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ElectroComponent Science and Technology
Volume 5, Issue 2, Pages 71-77
http://dx.doi.org/10.1155/APEC.5.71

A Screening Technique for Establishing the Stability of Metal Film Resistors

R & C Division, Electronics Corporation of India Ltd., Hyderabad 500 762, India

Received 8 January 1977; Accepted 15 June 1977

Copyright © 1978 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.