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ElectroComponent Science and Technology
Volume 9, Issue 3, Pages 209-211
http://dx.doi.org/10.1155/APEC.9.209

Allowable Power in NiCr Film Resistors

Institute of Electron Technology of Technical University, Wroclaw 50–370, Poland

Received 15 April 1981; Accepted 20 October 1981

Copyright © 1982 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

This paper reports the dependence between the power required to cause destruction and the dimensions of resistive films, i.e. the width and thickness. The dependence has been analysed using destruction phenomenon models which consider the increase of temperature of the resistive films and the films defects. Results show that the power value required to cause destruction rises linearly with the width of the resistor films and is exponentially proportional to the sheet resistance.