Walter Vermeirsch, "Comparative Study of Thick Film Dielectrics", Active and Passive Electronic Components, vol. 10, Article ID 814260, 15 pages, 1983. https://doi.org/10.1155/APEC.10.295
Comparative Study of Thick Film Dielectrics
SEM–observation and analysis provide a quick and reliable method of predicting the cross-over and multilayer characteristics of a dielectric paste. Surface and bulk porosity, flow behaviour and chemical composition, determined by SEM are closely related to the results of electrical and environmental tests. From the latter, voltage breakdown and humidity tests should be selected as most suitable for the comparison of various systems.
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