Active and Passive Electronic Components

Active and Passive Electronic Components / 1983 / Article

Open Access

Volume 10 |Article ID 814260 | https://doi.org/10.1155/APEC.10.295

Walter Vermeirsch, "Comparative Study of Thick Film Dielectrics", Active and Passive Electronic Components, vol. 10, Article ID 814260, 15 pages, 1983. https://doi.org/10.1155/APEC.10.295

Comparative Study of Thick Film Dielectrics

Received19 Apr 1982
Accepted22 Jun 1982

Abstract

SEM–observation and analysis provide a quick and reliable method of predicting the cross-over and multilayer characteristics of a dielectric paste. Surface and bulk porosity, flow behaviour and chemical composition, determined by SEM are closely related to the results of electrical and environmental tests. From the latter, voltage breakdown and humidity tests should be selected as most suitable for the comparison of various systems.

Copyright © 1983 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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