Active and Passive Electronic Components

Active and Passive Electronic Components / 1983 / Article

Open Access

Volume 11 |Article ID 945983 | https://doi.org/10.1155/APEC.11.71

Jørgen Møltoft, "Reliability Assessment and Screening by Reliability Indicator Methods", Active and Passive Electronic Components, vol. 11, Article ID 945983, 14 pages, 1983. https://doi.org/10.1155/APEC.11.71

Reliability Assessment and Screening by Reliability Indicator Methods

Received20 Oct 1982
Accepted28 Jan 1983

Abstract

Built-in flaws in electronic components have been recognized as a serious cause of failure. They are difficult to screen away by conventional methods because the times-to-failures for component working in systems are often rather long and because accelerated burn-in may screen by the wrong failure mechanisms. As an alternative, the concept and possible use of reliability indicator methods are discussed and some recently developed methods described.

Copyright © 1983 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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