Jørgen Møltoft, "Reliability Assessment and Screening by Reliability Indicator Methods", Active and Passive Electronic Components, vol. 11, Article ID 945983, 14 pages, 1983. https://doi.org/10.1155/APEC.11.71
Reliability Assessment and Screening by Reliability Indicator Methods
Built-in flaws in electronic components have been recognized as a serious cause of failure. They are difficult to screen away by conventional methods because the times-to-failures for component working in systems are often rather long and because accelerated burn-in may screen by the wrong failure mechanisms. As an alternative, the concept and possible use of reliability indicator methods are discussed and some recently developed methods described.
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