Open Access
R. B. Pranchov, D. S. Campbell, "Model for Reliability Prediction of Thick Film Resistors", Active and Passive Electronic Components, vol. 11, Article ID 391890, 6 pages, 1984. https://doi.org/10.1155/APEC.11.185
Model for Reliability Prediction of Thick Film Resistors
Abstract
A model for time-to-failure prediction based on component parameter drift is described. The idea for creation of this model is based on the influence of time-dependent random and non random factors on the distribution of the random variable.The reliability interpretation of the data from thick film resistor ageing tests has been completed with the model developed. Two different drift functions are described for two ruthenium-based thick film methods with equal resistivity – 10
Copyright
Copyright © 1984 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.