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ElectroComponent Science and Technology
Volume 11, Issue 2, Pages 185-190

Model for Reliability Prediction of Thick Film Resistors

1On leave of absence at Loughborough University of Technology from the Higher Institute of Mechanical and Electrical Engineering, Telecommunication Department, Sofia 1156, Bulgaria
2Department of Electronic and Electrical Engineering, Loughborough University of Technology, Leicestershire, Loughborough, UK

Copyright © 1984 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. B. Pranchov and D. S. Campbell, “Model for Reliability Prediction of Thick Film Resistors,” ElectroComponent Science and Technology, vol. 11, no. 2, pp. 185-190, 1984.