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M. Wolf, F. Müller, H. Hemschik, "Comment on the Dependence of R□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)", Active and Passive Electronic Components, vol. 12, Article ID 068618, 3 pages, 1985. https://doi.org/10.1155/1985/68618
Comment on the Dependence of R□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)
Abstract
The heterogeneous structure of TFR's results in high resistivities and high current noise. Accepting models of
conduction in TFR's, according to which the resistivity is determined by a resistance independent of bulk-resistivity
of a metallic-like component, it will be shown, that R□ and
Copyright
Copyright © 1985 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
