M. Wolf, F. Müller, H. Hemschik, "Comment on the Dependence of R□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)", Active and Passive Electronic Components, vol. 12, Article ID 068618, 3 pages, 1985. https://doi.org/10.1155/1985/68618
Comment on the Dependence of R□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)
The heterogeneous structure of TFR's results in high resistivities and high current noise. Accepting models of conduction in TFR's, according to which the resistivity is determined by a resistance independent of bulk-resistivity of a metallic-like component, it will be shown, that R□ and (describing current noise behaviour) increase with d and d3, respectively, when d is the grain size. On the other hand, both quantities depend on the volume fraction of the metallic component in the same manner. This leads to the conclusion, that a general dependence in the form = f(R□) cannot exist.
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