Active and Passive Electronic Components

Active and Passive Electronic Components / 1985 / Article

Open Access

Volume 12 |Article ID 068618 | https://doi.org/10.1155/1985/68618

M. Wolf, F. Müller, H. Hemschik, "Comment on the Dependence of R and Current Noise on Grain Size in Thick Film Resistors (TFR's)", Active and Passive Electronic Components, vol. 12, Article ID 068618, 3 pages, 1985. https://doi.org/10.1155/1985/68618

Comment on the Dependence of R and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Received03 Sep 1984
Accepted06 Nov 1984

Abstract

The heterogeneous structure of TFR's results in high resistivities and high current noise. Accepting models of conduction in TFR's, according to which the resistivity is determined by a resistance independent of bulk-resistivity of a metallic-like component, it will be shown, that R and Ceff*(describing current noise behaviour) increase with d and d3, respectively, when d is the grain size. On the other hand, both quantities depend on the volume fraction of the metallic component in the same manner. This leads to the conclusion, that a general dependence in the form Ceff*= f(R) cannot exist.

Copyright © 1985 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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