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Active and Passive Electronic Components
Volume 12, Issue 1, Pages 59-61
http://dx.doi.org/10.1155/1985/68618

Comment on the Dependence of R and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Zentralinstitut für Festkorperphysik und Werkstofforschung der Akademie der Vdissenschaften der DDR, Dresden DDR-8027, Germany

Received 3 September 1984; Accepted 6 November 1984

Copyright © 1985 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

M. Wolf, F. Müller, and H. Hemschik, “Comment on the Dependence of R and Current Noise on Grain Size in Thick Film Resistors (TFR's),” Active and Passive Electronic Components, vol. 12, no. 1, pp. 59-61, 1985. https://doi.org/10.1155/1985/68618.