Abstract
The problems in forming a useful model of a thick film component have been analysed. The need for such a model has been shown. Common features of thick film structures have been defined and, using the example of resistive film models that have been presented by previous authors, the trends in thick film structure modelling have been shown. Limitations of previous models have been described and, using the example of thick film resistors, the components of structure which should be taken into consideration in a complete model have been compiled. The problems in dealing with model verification, especially with regard to the choice of the criteria of quality and also in the choice of the measuring methods for obtaining component characteristics together with the values of the structural parameters, have been presented. Possible stages in the formation process of such a model and also research directions which could improve the process have been suggested.