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Active and Passive Electronic Components
Volume 12 (1986), Issue 2, Pages 127-135
http://dx.doi.org/10.1155/1986/37913

Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors

1Institute of Electron Technology, Technical University of Wroclaw, Wyb. Wyspianskiego 27, Wroclaw 50-370, Poland
2Section of Physics, Technical University of Dresden, Mommsenstr. 13, Dresden 8027, Germany

Copyright © 1986 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Thick Ni-P films have been widely investigated at our Institute. This article tends to visualize by use of various microscopic methods how the growth and sintering of individual conducting grains, results in the formation of nickel dendrites responsible for the metallic character of electrical conduction.