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Active and Passive Electronic Components
Volume 12 (1986), Issue 2, Pages 127-135
http://dx.doi.org/10.1155/1986/37913

Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors

1Institute of Electron Technology, Technical University of Wroclaw, Wyb. Wyspianskiego 27, Wroclaw 50-370, Poland
2Section of Physics, Technical University of Dresden, Mommsenstr. 13, Dresden 8027, Germany

Copyright © 1986 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Barbara Holodnik, Abram Jakubowicz, Marian Lukaszewicz, and Wolfgang Hauffe, “Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors,” Active and Passive Electronic Components, vol. 12, no. 2, pp. 127-135, 1986. doi:10.1155/1986/37913