TY - JOUR AU - Møltoft, J. PY - 1987 DA - 1900/01/01 TI - Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper) SP - 023687 VL - 12 AB - SN - 0882-7516 UR - https://doi.org/10.1155/1987/23687 DO - 10.1155/1987/23687 JF - Active and Passive Electronic Components PB - Hindawi Publishing Corporation KW - ER -