Active and Passive Electronic Components

Active and Passive Electronic Components / 1988 / Article

Open Access

Volume 13 |Article ID 054096 | https://doi.org/10.1155/1988/54096

F. Müller, M. Wolf, "Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments", Active and Passive Electronic Components, vol. 13, Article ID 054096, 6 pages, 1988. https://doi.org/10.1155/1988/54096

Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments

Received04 Sep 1986
Accepted30 Mar 1987

Abstract

Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.

Copyright © 1988 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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