F. Müller, M. Wolf, "Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments", Active and Passive Electronic Components, vol. 13, Article ID 054096, 6 pages, 1988. https://doi.org/10.1155/1988/54096
Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments
Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.
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