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Active and Passive Electronic Components
Volume 13 (1988), Issue 1, Pages 1-6

Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments

Zentralinstitut für Festkörperphysik und Werkstofforschung der Akademie der Wissensenchaften der DDR, Dresden, Germany

Received 4 September 1986; Accepted 30 March 1987

Copyright © 1988 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.