Active and Passive Electronic Components

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Active and Passive Electronic Components / 1989 / Article

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Open Access

Volume 13 |Article ID 36201 | 5 pages | https://doi.org/10.1155/1989/36201

Study of Thick Film Resistors By 1/f Noise Measurements

A. Ambrózy,1 E. Hahn,1 L. B. Kiss,2 and G. Trefán2

1Technical University, Hungary

2JATE University, Hungary

Received07 May 1988
Accepted08 Aug 1988

Abstract

Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.

Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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