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Open Access
A. Ambrózy, E. Hahn, L. B. Kiss, G. Trefán, "Study of Thick Film Resistors By 1/f Noise Measurements", Active and Passive Electronic Components, vol. 13, Article ID 036201, 5 pages, 1989. https://doi.org/10.1155/1989/36201
Study of Thick Film Resistors By 1/f Noise Measurements
Received07 May 1988
Accepted08 Aug 1988
Abstract
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.
Copyright
Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
