A. Ambrózy, E. Hahn, L. B. Kiss, G. Trefán, "Study of Thick Film Resistors By 1/f Noise Measurements", Active and Passive Electronic Components, vol. 13, Article ID 036201, 5 pages, 1989. https://doi.org/10.1155/1989/36201
Study of Thick Film Resistors By 1/f Noise Measurements
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.
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