Active and Passive Electronic Components

Active and Passive Electronic Components / 1989 / Article

Open Access

Volume 13 |Article ID 036201 | https://doi.org/10.1155/1989/36201

A. Ambrózy, E. Hahn, L. B. Kiss, G. Trefán, "Study of Thick Film Resistors By 1/f Noise Measurements", Active and Passive Electronic Components, vol. 13, Article ID 036201, 5 pages, 1989. https://doi.org/10.1155/1989/36201

Study of Thick Film Resistors By 1/f Noise Measurements

Received07 May 1988
Accepted08 Aug 1988

Abstract

Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.

Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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