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Active and Passive Electronic Components
Volume 13, Issue 3, Pages 191-195
http://dx.doi.org/10.1155/1989/36201

Study of Thick Film Resistors By 1/f Noise Measurements

1Technical University, Budapest H-1521, Hungary
2JATE University, Szeged H-6720, Hungary

Received 7 May 1988; Accepted 8 August 1988

Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.

In this paper investigations based on temperature dependent 1/f noise measurements are reported.